The new Pallet Integrity Inspection System (PAIS) from Sick enables non-contact 3D quality control of unloaded and loaded pallets.
PAIS uses 3D cameras to automatically detect damage such as cracks, missing and chipped parts, twisted blocks or protruding nails that could impair the stability or handling of the pallet. This guarantees the mechanical integrity and full usability of the analysed pallet and thus not only avoids disruptions to intralogistics processes, but also improves their productivity by accelerating workflows and reducing system downtimes.
Mechanical construction of the pallet in the Multi-Check
The PAIS achieves its particular speed and quality during pallet inspection through the use of four TriSpector 3D laser triangulation cameras from Sick. They scan the loading area, the pallet base, all four sides and the internal components of a pallet as required, and detect any mechanical defects. The PAIS evaluation unit - a SIM controller from Sick - analyses the scan results and immediately determines the condition of the inspected pallet. This rapid feedback also enables the Use at high transport speeds. Thanks to the use of robust and surface-independent laser triangulation, even wet, discoloured or dirty pallets can be reliably inspected. This reliably prevents the introduction of damaged pallets into material flow, handling and storage processes.
Flexible in design, seamless in integration
The PAIS offers OEMs and users intuitive software operation, which can also be used to customise limit values for different types of defects and individual pallet elements, for example. In addition to the basic inspection routines, the PAIS also offers the following functions for carrying out customised inspection tasks Individual customisation options - The results of which are also incorporated into quality control statistics. In terms of integration, the PAIS impresses with its robust, space-saving design and industry-standard connectivity. This ensures a fast and seamless connection to a conveyor line as well as to OT and IT systems.
Source: Sick
